The Titan Themis is a double-corrected, monochromated Transmission Electron Microscope (TEM) and is valued at €6 million. A further €3 million worth of specialist equipment has been added to the UL machine including the ultra-fast and sensitive Gatan K2 detector, as well as Dens Solutions environmental holders for real time, in-situ microscopy.
Easy access to atomic information:
The FEI Titan™ Themis provides easy access to atomic information. It combines proven spherical aberration (Cs)-correctors, monochromator system and sensitive ChemiSTEM™ technology, with the new enhanced piezo stage, FEI Velox™ software, and Gatan K2 camera
—delivering the fastest navigation and instant-zoom to link details from the mesoscopic to the atomic length scales
Superior performance for faster answers:
At the heart of Titan Themis is FEI's powerful new Velox software. Velox delivers multi-signal detection from up to four signals simultaneously to accelerate scanning transmission electron microscopy (S/TEM) imaging. Gain insight into chemistry and bonding states quickly, acquiring simultaneous energy dispersive spectroscopy (EDS) at 100,000 spectra/second and electron energy loss spectroscopy (EELS) data with speeds up to 1000 spectra/ second. With faster time to results delivered by Velox, 3D data is attainable in the same amount of time as was required for 2D in the past.
Superior S/TEM image quality: FEI Velox Capture software and Cs-corrected optics deliver superior image quality with the new live Drift Corrected Frame Imaging (DCFI) smart scanning technology. This technology can be combined with recursive chemical imaging capabilities of the Titan Themis. The total acquired data set is then available for post processing.
Empower analysis: Power up quantitative analysis with the FEI Velox scripting engine. The scripting engine works with the CPython programming language widely used in research to enable easy, reliable data mining.
The JEM-2100Plus TEM is a multi-purpose Transmission Electron Microscope, equipped for atomic resolution TEM, diffraction, tomography (70 degrees tilt angle), STEM and EDX work. The JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies. It operates at 200kv.
The Helios G4 HX DualBeam combines an industry-leading SEM with the most advanced FIB for best-in-class imaging and milling performance. Designed for high-throughput, high-quality, ultra-thin TEM lamella preparation, it comes with the FEI EasyLift EX Nanomanipulator and new Automated QuickFlip shuttle for precise, accurate, and repeatable in situ sample lift-out and manipulation.
This Precision saw cuts virtually any material with minimal deformation and micron sample positioning allows for precise sectioning of specimens.
System Configuration: Grinder/polisher base with pneumatic/electrically-driven head Sample Capacity: Individual force mode,up to 6 samples; central force mode, up to 10 samples per holder, depending on the holder Sample Sizes: 1″ to 2″ (25mm to 50mm) diameter mounted samples
VibroMet 2 Vibratory Polisher is designed to prepare high quality polished surfaces on a wide variety of materials, including EBSD applications. The 7200 cycles per minute horizontal motion produces a very effective polishing action, providing superior results, exceptional flatness and less deformation.
The K550X system employs a Magnetron Target Assembly, which enhances the efficiency of the process using low voltages, and giving a fine grain; cool sputtering, without the need to cool the target or the specimen stage. The specimen stage accommodates a range of specimen types and stubs, which together with pre-selectable parameters and automatic control, gives defined and repeatable film thickness depositions.
This plasma cleaner offers the most effective removal of hydrocarbon contamination on transmission electron microscope (TEM) and scanning electron microscope (SEM) samples.
With TenuPol-5 a perforated specimen for transmission electron microscopy can be made from a sample of 3 or 2.3 mm dia. in just a few minutes. The specimen is polished from both sides simultaneously, thus providing a structure with a minimum of deformation.
Preferred method for cutting transmission electron microscope (TEM) discs from metals, alloys, and all ductile materials.
The Specimen Mounting Hot Plate is recommended as a safe and reliable means of applying the low melting point wax required to securely attach specimen materials being cut, polished or grinded.
Cut your brittle materials beyond the 3 mm transmission electron microscope (TEM) disc to accurately cut holes or unique shapes. Quickly cut simple holes, unique shapes or TEM discs. Materials ranging in thickness from <40μm to 5mm are quickly and easily cut using a piezo-electric crystal driving a tubular cutting tool in a fine grain, boron carbide slurry.
Rapid material removal with minimal damage. Dimple grinding offers a fast and reliable mechanical method of pre-thinning to near electron transparency (in some cases to electron transparency) greatly reducing ion milling times and uneven thinning.