Transmission Electron Microscopy University of Limerick
Welcome
The Transmission Electron Microscopy research group at the University of Limerick (TEMUL) is led by Prof Ursel Bangert the Bernal Chair in Microscopy and Imaging and senior Professor at the University of Limerick Department of Physics.
Prof Bangert is the Co-Principal Investigator on the H2020 EU Project MagnaPharm, the SFI funded US-Ireland project ‘conducting domain walls for novel nano-electronics’, and the Volkswagenstiftung funded project 'New Single Photon Sources by Engineering Monolayer-Thick Semiconductors on the Atomic Scale'. Prof Bangert is the President of the Microscopy Society of Ireland, and is heavily involved in the Department of Physics Athena Swan committee.
Prof Bangert's career of over 30 years in the field of electron microscopy research includes academic positions at the Universities of Manchester, Surrey and Forschungszentrum Jülich. Prof Bangert was heavily involved in the conception and managerial activities of Electron Microscopy Facilities at Liverpool (NorthWest STEM; Co-I) and at Daresbury (SuperSTEM; Co-I), and overseeing the Manchester University School of Materials Electron Optical facilities. She is currently building up an international centre for ultra-high resolution imaging and characterisation at the University of Limerick. Prof Bangert was awarded SFI funding for a double corrected and monochromated Titan Themis, analytical transmission electron microscope, a full selection of in-situ TEM holders (liquid, electrochem, heating, biasing, and gas) and a fast direct electron detector Gatan K2 camera.
Imaging is carried out in diffraction contrast and phase contrast mode, as well as in scanning TEM (STEM), especially in high annular dark field (HAADF) STEM mode.
Electron Energy Loss Spectroscopy is an absorption spectroscopy technique, where the energy, absorbed from the incoming electron beam when passing through the sample, is measured with high energy and spatial resolution.
Plasmons are collective excitations in materials exhibiting metallic and semiconducting properties, and, depending on the material, occur over an energy range from tens of eV down to the meV regime.
A tomographic series is and image series of the same feature taken at varying angles. The images can then be used to recreate a 3D model of the object being imaged.